Abstract: Atomic force microscope (AFM) is used to scan the topography of samples using a sharp probe; however, conventional AFM devices are limited by XY scanners based on piezoelectric actuation.
Abstract: A two-mode buck converter to accommodate both light and heavy load is presented in this paper. The converter operates in the heavy-buck mode optimized for heavy load and the baby-buck mode ...
Owners of older cars with Google-based infotainment systems will have to wait longer to get easier access to the driving modes.
AI Mode will preface its list of sources with an AI-generated snippet about why they’re relevant. AI Mode will preface its list of sources with an AI-generated snippet about why they’re relevant. is a ...
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